NANOS DESKTOP SEM-EDS
SEMPLOR high-tech company based in Eindhoven Netherlands, crucible NANOS offers SEM imaging, a comprehensive and affordable tabletop SEM for high-resolution imaging and integrated energy dispersive spectroscopy (EDS) for rapid elemental analysis. It is designed for easy installation, ease of use and easy servicing. Perfect for research & development, educational & industrial usage.
- High Performance SED & 4 Quad BSE Detectors
- EDX ‒ Spot Analysis & Element Mapping
- Low Vacuum Capability
- Motorised XY Stage & Eucentric Tilt
- Filament Performance Optimisation
- Easy to Use GUI
- Robust modern design (Ducth, Netherlands)
- Easy access for maintenance and upgrades
- Low Service Costs
| IMAGING MODES | Optical SEM
Resolution |
Magnification range: 2 – 12x Magnification range: 50 – 200,000x |
| ILLUMINATION | Optical | Bright field |
| SEM | Optimized thermionic source (tungsten) | |
| Acceleration voltages | Default: 1, 2, 5, 7, 10, 15 & 20 kV | |
| Adjustable range between 1 & 20kV | ||
| DETECTOR | Secondary electron detector (SED) | |
| Backscattered electron detector (BSD) – 4 quadrant | ||
| Energy Dispersive Spectroscopy detector (EDS) – integrated |
NANOS ̶̶ the Microscope
The NANOS is a comprehensive and affordable tabletop scanning electron microscope (SEM). It is engineered using the latest technology, giving fast and high quality SEM images and elemental analysis. Its design is robust and modern, which makes it perfect for research & development, educational and industrial usage.
Detectors
The NANOS comes with both a Secondary Electron Detector (SED) and a Back Scattered Electron Detector (BSD) as standard. The BSD is a 4-quadrant detector with fully controllable independent segments. By utilizing
the segments in different combinations, it provides compositional or topographical detail from the sample, as well as images with a ‘shading-effect’ by highlighting the surface from multiple directions.
An Energy Dispersive X-ray (EDX) Silicon Drift Detector (SDD) is installed for Elemental Analysis.
Elemental Analysis
The NANOS comes with a fully integrated Energy Dispersive X-ray (EDX) Silicon Drift Detector (SDD). Via the User Interface operator can select EDX Point Analysis or activate Elemental Mapping.
SEMPLOR was founded in 2021 by seasoned electron microscopy experts. The NANOS has been developed by passionate innovators with an extensive network and deep-understanding of EM technology and engineering. All together the team has more than 200+ years EM experience with Philips, #FEI, #Phenom & #ThermoFisher #SEM #scanning electron microscope #electron microscope #microscopy #EDX
This video demonstrates how a sample is loaded in the NANOS tabletop SEM, the next generation Scanning Electron Microscope.
