NANOS DESKTOP SEM-EDS Phe-nx, the NANOS offers SEM imaging at a low cost of ownership for high-resolution imaging and integrated energy dispersive spectroscopy (EDS) for
IMT i-Solution_Image Analyzer Image analyzer is the brain of modern microscopy system. Besides performing the routine jobs of processing and analysing the microscopy image,
IMT i-Solution_Total Imaging Solution_PRO Measurement iSolution family of software helps you keep pace with today’s rapidly changing digital technology. This exceptional software technology and leading
X-ray fluorescence technology to determine the thickness and composition of plating deposits with exceptional accuracy. Measurement is performed by exposing a precisely defined area of
X-Ray Fluorescence XRF Plating Measurement XRF instruments use X-ray fluorescence technology to determine the thickness and composition of plating deposits with exceptional accuracy. Measurement is
Cressington 108 Sputter Coaters are ideal for routine sample preparation. Compact, economical and simple to operate, they offer rapid pump down times, fine-grain coatings and
Cressington 208HR now offers real solutions to the problems encountered when coating difficult samples for FE-SEM. In oder to minimize the effects of grain size
Vickers Hardness Tester State-of-the-art hardness testing machines can be applied in wide range of applications, by virtue of the innovative mechatronic technology for high-precision testing,
WAFER INSPECTOR Designed to deliver fast & convenient viewing of large microscopic objects, system is a digital inspector suitable for routine inspection jobs of wafer
